en.wikipedia.org/w/index.php?title=Elastic_recoil_detection&diff=prev&oldid=1372...
5 corrections found
ERDA has been used since 1974.
The documented origin of ERDA is 1975–1976, not 1974. Historical reviews date the development of ERD to 1975, and the first detailed paper describing the method was published in 1976.
Full reasoning
Historical sources do not support 1974 as the start of elastic recoil detection analysis.
- A 2026 historical review says “The year 2025 celebrates the 50 years of the development” of ERD, which places its development in 1975, not 1974.
- The original paper commonly cited as the first detailed description of the method is L’Ecuyer and coauthors’ 1976 paper, “An accurate and sensitive method for the determination of the depth distribution of light elements in heavy materials.”
- A standard reference work likewise states that in 1976 a Canadian group described the method in detail for the first time.
So the statement that ERDA “has been used since 1974” is inconsistent with the documented historical record.
3 sources
- 50 years of elastic recoil detection: How it started
The year 2025 celebrates the 50 years of the development of a technique now mainstream in Ion Beam Analysis: Elastic Recoil Detection (ERD).
- An accurate and sensitive method for the determination of the depth distribution of light elements in heavy materials
Journal of Applied Physics 47 (1), 381-382, 1976-01-01. A method for the determination of the depth distribution of light elements in heavy materials is described.
- Elastic Recoil Detection Analysis
In 1976, a Canadian group described in detail for the first time a new ion beam analytical method based on the elastic recoil of target nuclei collided with high energy heavy incident ions.
In case of RBS, the detector is placed in the back of the sample whereas in ERDA, the detector is placed in the front.
This misdescribes standard RBS geometry. In Rutherford backscattering spectrometry, detectors are typically set at a large backscattering angle on the same side as the incident beam, not behind the sample.
Full reasoning
The sentence is wrong about RBS detector placement.
Rutherford backscattering spectrometry detects backscattered ions. In a standard RBS setup, the detector is positioned at a large scattering angle (for example around 165°), i.e. on the same side as the incident beam so it can collect ions scattered back out of the sample. It is not placed “in the back of the sample” as though it were behind the target in transmission geometry.
Authoritative descriptions of RBS geometry say exactly this:
- The University of Minnesota’s ion beam analysis facility lists a “Fixed ion detector at 165° for Rutherford backscattering spectrometry (RBS)”.
- ANSTO explains that “In RBS, only backscattered ions are detected.”
- Aalto University’s RBS description says the scattered ion beam hits the detector, which is positioned at the wanted angle.
So the article’s description of RBS detector placement is incorrect.
3 sources
- Ion Beam Analysis | College of Science and Engineering
Fixed ion detector at 165° for Rutherford backscattering spectrometry (RBS).
- Rutherford Backscattering | ANSTO
In RBS, only backscattered ions are detected.
- Rutherford backscattering spectrometry - Solid State Chemistry @Aalto - Aalto University Wiki
From the sample the scattered ion beam hits the detector, which is positioned at the wanted angle.
The gyrofrequency of an electron is calculated to be 1.76x107 Brad/second.
This value and unit are wrong. For electrons, the cyclotron angular frequency is about 1.7588×10^11 rad s^-1 T^-1 (or 28 GHz at 1 T), not 1.76×10^7 “Brad/second.”
Full reasoning
The numerical value and the unit in this sentence are incorrect.
For an electron, the cyclotron angular frequency is
[
\omega = \frac{|q|B}{m_e} = \frac{e}{m_e}B
]
The accepted value of electron cyclotron frequency per magnetic field is about 1.7588×10^11 rad s^-1 T^-1. Equivalently, at 1 tesla, the ordinary cyclotron frequency is about 28 GHz, which corresponds to an angular frequency of 2π × 28 GHz ≈ 1.76×10^11 rad/s.
So the article’s 1.76×10^7 value is off by about four orders of magnitude, and the unit “Brad/second” is also wrong here. Standard references give the quantity in rad s^-1 T^-1 (or Hz/T for ordinary frequency).
2 sources
- Particle Data Group: Physical Constants
electron cyclotron freq./field ... 1.758 820 150(44)×10^11 rad s−1 T−1
- MIT OpenCourseWare: The Lorentz Law in Free Space
For a flux density of 1 tesla, the cyclotron frequency is fc = ωc/2π = 28 GHz.
The Fundamental aspects in dealing with recoil spectroscopy involves electron back scattering process of matter such as thin films and solid materials.
ERDA/RBS are ion-beam techniques, not electron backscattering techniques. Standard definitions describe Rutherford backscattering as the scattering of energetic probe ions such as He+ or H+, not electrons.
Full reasoning
This sentence misidentifies the particles involved.
Recoil spectroscopy in this context refers to elastic recoil detection analysis (ERDA) and closely related Rutherford backscattering spectrometry (RBS). These are ion beam analysis methods. They use energetic ions (commonly He⁺, H⁺, or heavier ions), and the measured signal comes from scattered or recoiled ions/atoms, not from electron backscattering.
Authoritative sources define RBS accordingly:
- IUPAC defines RBS as a method in which monoenergetic, singly charged probe ions scattered from the surface are detected.
- Aalto University’s RBS overview says the method is based on ion beam scattering and explicitly notes that the ion beams interact mainly with nuclei.
So describing the fundamental process here as electron back scattering is incorrect.
2 sources
- IUPAC Gold Book: Rutherford backscattering spectrometry
Measurement method ... in which principally monoenergetic, singly charged probe ions scattered from the surface with a Rutherford cross section are detected and recorded ... RBS is a form of ion beam analysis.
- Rutherford backscattering spectrometry - Solid State Chemistry @Aalto - Aalto University Wiki
RBS is a characterization method, which is based on ion beam scattering from target sample. The ion beams interact mainly with nuclei.
These elemental constituents of the polymer film (Bi, K, Mg, O, along with carbon contamination) were detected using an ionization chamber.
BKBO/Ba1−xKxBiO3 is an oxide superconductor, not a polymer film. Its composition is barium–potassium–bismuth oxide; magnesium is not part of the BKBO formula and would instead come from a substrate such as MgO.
Full reasoning
This sentence mixes up the nature and composition of the BKBO film.
The surrounding text is discussing BaBiKO/BKBO, i.e. barium potassium bismuth oxide superconducting thin films. Authoritative materials references identify BKBO as an oxide superconductor with formula Ba1−xKxBiO3 (for example Ba0.6K0.4BiO3), not a polymer film.
The sentence is also wrong to list Mg as if it were a constituent of the BKBO film itself. A BKBO thin-film paper from TUM describes the films as Ba1−xKxBiO3 and separately notes growth on MgO substrates. That means magnesium can belong to the substrate, not the BKBO compound formula.
So this sentence is incorrect in two ways:
- it calls the BKBO sample a polymer film even though BKBO is an oxide superconductor; and
- it presents Mg as a film constituent even though the BKBO composition is Ba–K–Bi–O.
2 sources
- NIST High Temp. Superconducting Materials (HTS) Database - Barium Potassium Bismuth Oxide
Title: Barium Potassium Bismuth Oxide ... Formula: Ba 0.6 K 0.4 BiO 3 ... Chemical Class: Oxide
- Ba1-xKxBiO3 Epitaxy on Various Substrate Materials - Technical University of Munich
We have fabricated Ba1-xKxBiO3 (BKBO) films ... As BKBO grows well on perovskites we deposited thin ... layers ... on MgO ... substrates.